Frequencies
DU-6021:

40Hz-200KHz,30 Points Selectable
DU-6022:

40Hz-200KHz programmable

 

Parameter
 L.C.R.Z.Q.D.ESR.θ
Measurement Range

 L : 0.001μH~1999.9H
 C : 0.001pF~199.99mF
 R : 0.1MΩ~19.999MΩ
 Z : 0.1MΩ~199.99MΩ
 Q : 0.01~1999.9
 D : 0.0001-19.999   
 ESR: 0.1MΩ~19.999MΩ
 θ : -180° + 180°

Features
Large LCD Display Window for Setups and Test Values
Easy Test Condition Setting with Auto Parameter Selection & Auto
 Ranging Function
Easy Manual Driven with Cursor Guiding Operation Mode
Battery Backup Function can Recall Test Parameter Setting before  Power Off
Wide Measuring Range & High accuracy 0.1%
Zeroing Offset Function
High Measurement Rate: 75ms
Various available options 

Specifications
Model DU-6021 DU-6022
Parameter L.C.R.Z.Q.D.ESR.θ
Test Voltage 0.1V, 0.25V, 0.3V, 0.5V, 1Vrms Selectable, 0.01V-2.55Vrms programmable, 10mV/step
Frequencies 100Hz, 120Hz, 1K, 10K, 100KHz and 40Hz-200KHz, 30 Points Selectable 100Hz, 120Hz, 1K, 10K, 100KHz Selectable, 40Hz-200KHz programmable, 1-10Hz
Display LCD display, 4 1/2 digits
Trigger Mode Internal,External,Fuzzy
Measurement Range

L: 0.001μH~1999.9H       
C: 0.001pF~199.99mF
R: 0.1mΩ~19.999MΩ       
Z: 0.1mΩ~199.99MΩ
Q: 0.01~1999.9
D: 0.0001-19.999   
ESR: 0.1mΩ~19.999MΩ
θ : -180° + 180°

Measurement Accuracy Basic accuracy: ± 0.1%
Measurement Rate Slow:400ms, Medium:180mS, Fast:75mS
Function Auto parameter selection, Auto ranging, Zeroing calibration
Battery backup Measurement status: parameter, test voltage, test frequency, test circuit (ser./par.)...
External DC bias 0-35 Vdc
Accessories Test clips ,Power cord, Operation manual, Certificate of calibration
Power 115/230 V ±10%, 50/60 Hz
Dimensions 360(W) x 110(H) x 350(D) mm
Weight 4.8 kg
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Order Information
DU-6021
High Extendable Programmable LCRZ Meter: 40Hz-200KHz, 30 Points Selectable
DU-6022
High Extendable Programmable LCRZ Meter: 40Hz-200KHz programmable
Standard Fittings
Fx60-0101
LCR Test Clips
Option Accessories
Fx60-0102
SMD Test Tweezers
Fx60-0103
High Frequency Test Cable
Fx60-0201
Double-Sided Test Box
Fx60-0202
SMD test box
Fx60-0203
One-sided Test box
Fx60-0301 SMD test bat
Cr60-GP00
GP-IB interface
Cr60-HD00
Handler interface
Cr60-RS00
RS-232 interface
Cr60-PR00
Printer interface
Of60-ME00
100 sets of memory
Of60-LS00
Many to scan and test frequently
Of60-DE00

DEVIATION Compensation :
Compensation of the measured data to match with reference value.

Of60-BN00
Sorting comparator:
Reference value & HI-LO Limits setting by BIN NO. or STEPS
mode, Limit of Q. D .R. θ Value, 10 BIN for sorting & BIN SUM count.
Of60-JU00
Judgement comparator:
Reference value & HI-LO Limits setting, Limit of Q. D. R Value,
GO/NG Judgement & indication with alarm.
Fx60-01010
Fx60-0102
Fx60-0103
Fx60-0201
Fx60-0202
Fx60-0203

Cr60-GP00
Cr60-HD00
Cr60-RS00
Cr60-PR00
Fx60-0301
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